Test and Measurement
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The need to address power during manufacturing test
Until recently, the idea of managing power during manufacturing test has been a secondary concern. But with shrinking geometries and lower voltage thresholds comes an increasing awareness that excessive power consumption during test can have an impact on digital IC reliability.
Three challenges for WiMedia compliance test
This article explains the concepts behind the UWB technology as well as the challenges surrounding compliance test of UWB transmitters, packet overhead, and receivers.
Mobile WiMAX PHY: Transmitter Power, Spectral Flatness, Spurious Emissions, and ACP
If you want your WiMAX radio to conform to specs, take a closer look at this article from Peter Cain at Agilent Technologies.
Silicon is only the beginning
Choosing the right package during the creation of a chip for the test phase of development and for the final device can not only reduce your time-to-market but also help you create tangible benefits for your customers.
Measuring insertion loss in automated test systems
One interesting use case for power meters is insertion loss characterization in automated test (ATE) systems. Read on to find out how it's done.
Tackling the Challenges of Pulsed Signal Measurements
This application note describes devices used in radar systems with pulsed signals, with emphasis on measurements made using vector network analyzers (VNAs), signal generators, vector signal generators, and spectrum analyzers.
Software techniques for comprehensive EMC testing of embedded systems
Joe Brotz describes the variety of ways in which a software engineer can provide help with embedded system electromagnetic compatibility (EMC) conformance and testing.
Get a fix on GPS
Spirent Communications and Agilent Technologies to join CSR in the EGPS Forum. Find out the latest on GPS, EGPS, and A-GPS..
MORE DESIGN CENTER
«October 2008 Test and Measurement
About the RF Test and Measurement How-To Section
RF DesignLine's Test and Measurement section is the design resource for engineers in the test and measurement stage of the design of RF and millimeter-wave and microwave systems. Topics cover test and measurement of systems compatible with 2G, 2.5G, 3G, EDGE, WCDMA, GPRS, GSM, WiMAX, UMTS, 3GPP, 3GPP2, HEDGE, WEDGE, HSDPA, Wi-Fi, Bluetooth, ZigBee, Wibree, ultrawideband and HSUPA networks.
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